| Course objectives: |
| Providing a comprehensive knowledge on structure/processing/application and performance relationship of the polymeric materials with special emphasis on the advanced, high performance engineering polymers |
| Course content and structure: |
| The objectives, techniques and application field of the surface investigations. Theoretical and experimental analysis of the gradient and heterogeneous surfaces, Complex characterisation of surface layers and coatings. Surface physics aspects of the tribological damages (surface tension, adhesion, atomistic description of friction processes). Methods and equipment of the investigation of surface geometrical features (2D and 3D parameters). Surface mechanical features at the micro – and nanoscale (scratch resistance, hardness, tribological properties). Microstructural investigation of the surface layers and coatings at different levels of the length scale (OM, SEM, TEM, AFM, XRD, EDX, Raman spectroscopy, etc). nanomechanical characterisation of the thin surface layers and films. Engineering application: investigation of the thin films, diffusional and coated layers, micro- and nanocomposites, MEMS/NEMS devices, magnetic storage systems. |
| Evaluation method: |
| Type of exam: written +oral. The oral examination can be performed if result of the written examination test exceeds the 50%. Evaluation: Summa scores=100. Percentage evaluation of the performance and marking by 1-5, as follows: 0-49%=1; 50-59%=2; 60-69%=3; 70-79%= 4; 80-100%= 5: |
| Required reading: |
| 1. B. Bhushan: Modern Tribology Handbook, Volume One, CRC Press, ISBN0-8493-8403-6, 2001.2. O'Connor, D.J., Sexton, B.A.: Surface Analysis Methods in Materials Science, Springer, 2003. pp1-585 |
| Suggested reading: |
| 1. D. Dowson: Experimental methods in tribology, Tribology series 44. Elsevier 2004. ISBN: 0 444 51589 52. Vickerman, G.C., Gilmore, I.: Surface Analysis: The Principal Techniques, 2nd Ed. Wiley, 2009., pp1-6863. Watts, J. F., Wolstenholme, J.: An Introduction to Surface Analysis by XPS and AES, John Wiley & Sons, 2003., pp1-212. |
